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Generated Negative Test Cases for Matter Operational Certificates (NOC, ICAC, RCAC) #24043
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emargolis
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Dec 14, 2022
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Generated Negative Test Cases for Matter Operational Certificates (NOC, ICAC, RCAC) #24043
emargolis
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emargolis:emargolis/feature/add-negative-test-vectors-to-op-certs
Dec 14, 2022
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PR #24043: Size comparison from edd2863 to 59cf36b Increases (41 builds for bl602, bl702, cc13x2_26x2, cyw30739, efr32, esp32, k32w, linux, mbed, nrfconnect, psoc6, qpg, telink)
Decreases (7 builds for cc13x2_26x2, linux)
Full report (42 builds for bl602, bl702, cc13x2_26x2, cyw30739, efr32, esp32, k32w, linux, mbed, nrfconnect, psoc6, qpg, telink)
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...ls/test/operational-certificates-error-cases/Chip-Test-ICAC-Ext-AKID-Length-Invalid-Key.chip
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PR #24043: Size comparison from edd2863 to bd90f7b Increases (41 builds for bl602, bl702, cc13x2_26x2, cyw30739, efr32, esp32, k32w, linux, mbed, nrfconnect, psoc6, qpg, telink)
Decreases (8 builds for cc13x2_26x2, esp32, linux)
Full report (42 builds for bl602, bl702, cc13x2_26x2, cyw30739, efr32, esp32, k32w, linux, mbed, nrfconnect, psoc6, qpg, telink)
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@emargolis ASAN claims a memory leak:
|
Should be fixed with the latest commit |
…C, ICAC, RCAC). Added python script that generates negative test vectors using chip-cert tool. Those new test vectors are used to verify failure scenarios for the following use cases: - Conversion of DER encoded operation certificate to CHIP TLV format - Conversion of CHIP TLV encoded certificate to DER format - Loading and parsing of the CHIP TLV encoded certificate - Checking validity of the certificate subject field As a result of these new test one bug was found and fixed in the ChipDN::DecodeFromTLV() function, where chipAttr should be used instead of attrOID when NodeId/FabricId validity is checked. Some extra validity checks were added to the following methods: - ConvertChipCertToX509Cert() - ConvertX509CertToChipCert() The chip-cert tool was updated and enhanced with more error cases.
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PR #24043: Size comparison from 10cccdc to 2f0a672 Increases (52 builds for bl602, bl702, cc13x2_26x2, cyw30739, efr32, esp32, k32w, linux, mbed, nrfconnect, psoc6, qpg, telink)
Decreases (8 builds for cc13x2_26x2, esp32, linux)
Full report (53 builds for bl602, bl702, cc13x2_26x2, cyw30739, efr32, esp32, k32w, linux, mbed, nrfconnect, psoc6, qpg, telink)
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Added python script that generates negative test vectors using chip-cert tool. Those new test vectors are used to verify failure scenarios for the following use cases:
As a result of these new test one bug was found and fixed in the ChipDN::DecodeFromTLV() function, where chipAttr should be used instead of attrOID when NodeId/FabricId validity is checked.
Some extra validity checks were added to the following methods:
The chip-cert tool was updated and enhanced with more error cases.